For semiconductor manufacturers it is important to be able to track and trace the physical movement and status of products as they travel through the supply chain. In the event of quality issues, the ability to quickly and accurately identify a defective product, analyze the root cause and contain impacted parts is critical. At NXP Semiconductors each product is traced, by manufacturing lot, through the manufacturing process and warehouse and distribution. Each manufacturing lot’s history is then available for analysis and containment. This product traceability data is kept in a central storage and reporting database. To facilitate business us-ers to access and interpret this data, we have applied Linked Data technologies to transform and integrate the data from traditional relational databases into an RDF graph representation. The RDF graph is then queried using the SPARQL query language to provision a JSON-LD API which used to develop a user-friendly web application.